Our research lab is focusing on investigate the materials and device properties via scanning probe microscopy(SPM). By using cross-section scanning tunneling microscopy(X-STM), we can explore the interfaces behavior of heterostructure system. With light and electric modulation, we can do in-situ measurement of the electronic structure and relevent properties of the surface or interface of operating devices, which is important for future electronics and novel materials system.

We keep developing the key technologies for SPM to probe the facinating materials world in atomic scale in collaboration with multidisciplinary and international research group, and provide the key information to pave the way for future electrnoics.